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Zeiss

FilmDetect®- surface coating property metrology in-line

FilmDetect® process control system by ZEISS is the fast and efficient stand-alone solution for surface coating property metrology in-line. It measures the thin film coating thickness, determines the region of the reflection upper limits and calculates colormetric values. Easily and individually adjustable, FilmDetect® by ZEISS fits into existing or newly designed coating processes.

FilmDetect® was designed by ZEISS for use at your desktop or fully integrated into your production line. It is based on our solid, reliable and compact Diode Array Spectrometers. It saves time and money through inline process monitoring and at your daily routine jobs.

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Carl Zeiss Spectroscopy GmbH continues in the company’s long tradition of using our in depth understanding of the wavelength-dependent nature of light to create innovative components and solutions to enhance the quality our customers products.
We continue to develop and produce optical gratings, optical modules, and spectrometer systems of highest quality, superior optical performance, robust design and fast analysis. To develop the optimum solutions we collaborate with our customers throughout the entire life cycle of the products, from conception to phase out of the product.

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