FilmDetect®- surface coating property metrology in-line
FilmDetect® process control system by ZEISS is the fast and efficient stand-alone solution for surface coating property metrology in-line. It measures the thin film coating thickness, determines the region of the reflection upper limits and calculates colormetric values. Easily and individually adjustable, FilmDetect® by ZEISS fits into existing or newly designed coating processes.
FilmDetect® was designed by ZEISS for use at your desktop or fully integrated into your production line. It is based on our solid, reliable and compact Diode Array Spectrometers. It saves time and money through inline process monitoring and at your daily routine jobs.